Compositional Generation of MC/DC Integration Test Suites

نویسنده

  • Alexander Pretschner
چکیده

We present a method for automatically generating tests for reactive systems specified by concurrently executing extended finite state machines. The generated test suites satisfy the modified condition/decision coverage criterion at unit and integration levels. The generation of MC/DC suites for eager first-order functional programs is subsumed. An industrial chip card case study illustrates the approach.

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عنوان ژورنال:
  • Electr. Notes Theor. Comput. Sci.

دوره 82  شماره 

صفحات  -

تاریخ انتشار 2003